MEASUREMENT OF ALAS INP AND INP IN0.52AL0.48AS HETEROJUNCTION BAND OFFSETS BY X-RAY PHOTOEMISSION SPECTROSCOPY

被引：25

作者：

WALDROP, JR

KRAUT, EA

FARLEY, CW

GRANT, RW

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1990年 / 8卷 / 04期

关键词：

D O I：

10.1116/1.584963

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：768 / 772

页数：5

共 16 条

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