MEASUREMENT OF THE MICROWAVE DIELECTRIC-CONSTANT FOR LOW-LOSS SAMPLES WITH FINITE THICKNESS USING OPEN-ENDED COAXIAL-LINE PROBES

This work addresses the effect of finite sample thickness on microwave dielectric constant measurements for thin, planar, low-loss samples using the open-ended coaxial-line probe method. Detailed measurements of the dielectric constant were carried out on a wide range of thicknesses of air samples which were backed by infinitely thick teflon and alumina dielectric media. The measurements were made at room temperature for various (50 OMEGA) coaxial-line dimensions, microwave frequencies 4-8 GHz, and power levels near a fraction of a mW. The results provide strong support for previously published theoretical calculations based on a boundary value problem which uses a spectral domain formulation for the aperture fields. From thin, planar samples, values of 10.4 +/- 0. 5 and 25.9 +/- 1. 3 were obtained at 5 GHz and 300 K for the bulk dielectric constant of MgO and LaAl2O3, respectively. The applicability of a simple empirical model based on an exponential fit is discussed.