THE SIZE EFFECT OF ION CHARGE TRACKS ON SINGLE EVENT MULTIPLE-BIT UPSET

被引：42

作者：

MARTIN, RC ^{[1
]}

GHONIEM, NM ^{[1
]}

SONG, Y ^{[1
]}

CABLE, JS ^{[1
]}

机构：

[1] TRW,REDONDO BEACH,CA 90278

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1987年 / 34卷 / 06期

关键词：

D O I：

10.1109/TNS.1987.4337470

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1305 / 1309

页数：5

共 13 条

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