PROBLEMS IN SIMULATION OF DARK-FIELD IMAGES IN X-RAY TOPOGRAPHY AND ELECTRON-MICROSCOPY

被引：7

作者：

EPELBOIN, Y ^{[1
]}

机构：

[1] UNIV PIERRE & MARIE CURIE,CNRS,MINERAL CRISTALLOG LAB,F-75230 PARIS 05,FRANCE

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1976年 / 9卷 / AUG1期

关键词：

D O I：

10.1107/S0021889876011497

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

收藏

页码：355 / 356

页数：2

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