HIGH-ACCURACY TRUE NORMAL-INCIDENCE ABSOLUTE REFLECTOMETER

被引:16
作者
BITTAR, A
HAMLIN, JD
机构
来源
APPLIED OPTICS | 1984年 / 23卷 / 22期
关键词
D O I
10.1364/AO.23.004054
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:4054 / 4067
页数:14
相关论文
共 14 条
[1]   PRECISION MEASUREMENT OF ABSOLUTE SPECULAR REFLECTANCE WITH MINIMIZED SYSTEMATIC ERRORS [J].
BENNETT, HE ;
KOEHLER, WF .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (01) :1-6
[2]   INFRARED REFLECTANCE OF EVAPORATED ALUMINUM FILMS [J].
BENNETT, HE ;
ASHLEY, EJ ;
BENNETT, JM .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1962, 52 (11) :1245-&
[3]  
BITTAR A, 1982, PEL713 REP
[4]  
BITTAR A, 1983, PEL834 REP
[5]   REFLECTOMETER FOR PRECISE MEASUREMENT OF ABSOLUTE SPECULAR REFLECTANCE AT NORMAL INCIDENCE [J].
BOIVIN, G ;
THERIAULT, JM .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (07) :1001-1002
[6]  
Born M., 1964, PRINCIPLES OPTICS
[7]   HIGH ACCURACY SPECTROPHOTOMETRY AT NATIONAL PHYSICAL LABORATORY [J].
CLARKE, FJJ .
JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1972, A 76 (05) :375-403
[8]  
GRAY DE, 1957, AIP HDB
[9]  
HEAVEN OS, 1965, PHYSICS THIN FILMS, V2
[10]   NEW REFERENCE SPECTROPHOTOMETER [J].
MIELENZ, KD ;
ECKERLE, KL ;
MADDEN, RP ;
READER, J .
APPLIED OPTICS, 1973, 12 (07) :1630-1641