RHEED OBSERVATIONS OF DISORDER ON SI(001)-(2X1) SURFACES

被引:21
作者
NORTON, NG
机构
[1] Physics Department, Imperial College, London,SW7 2BZ, United Kingdom
关键词
I would like to thank British Telecom for the silicon wafers; Drs P J Dobson and B A Joyce for many helpful discussions and the Science and Engineering Research Council for a Research Studentship;
D O I
10.1016/0042-207X(83)90583-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:621 / 624
页数:4
相关论文
共 17 条