INVERSION OF NORMAL-INCIDENCE (R,T) MEASUREMENTS TO OBTAIN N + IK FOR THIN-FILMS

被引：79

作者：

PAULICK, TC

机构：

来源：

APPLIED OPTICS | 1986年 / 25卷 / 04期

关键词：

D O I：

10.1364/AO.25.000562

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

收藏

页码：562 / 564

页数：3

相关论文

共 10 条

[1] COMPUTATIONAL METHOD FOR DETERMINING N AND K FOR THIN FILM FROM MEASURED REFLECTANCE TRANSMITTANCE AND FILM THICKNESS
BENNETT, JM
BOOTY, MJ
[J]. APPLIED OPTICS, 1966, 5 (01): : 41 - &
[2] OPTICAL CHARACTERIZATION OF AMORPHOUS-SILICON HYDRIDE FILMS
CODY, GD
WRONSKI, CR
ABELES, B
STEPHENS, RB
BROOKS, B
[J]. SOLAR CELLS, 1980, 2 (03): : 227 - 243
[3] Heavens O. S., 1955, Optical Properties of Thin Solid Films, Dover Books on Physics and Mathematical Physics
[4] Henrici P., 1982, Essentials of Numerical Analysis with Pocket Calculator Demonstrations
[5] DETERMINATION OF OPTICAL-CONSTANTS OF ABSORBING MATERIALS USING TRANSMISSION AND REFLECTION OF THIN-FILMS ON PARTIALLY METALLIZED SUBSTRATES - ANALYSIS OF THE NEW (T,RM) TECHNIQUE
HJORTSBERG, A
[J]. APPLIED OPTICS, 1981, 20 (07): : 1254 - 1263
[6] DERIVATION OF OPTICAL-CONSTANTS OF METALS FROM THIN-FILM MEASUREMENTS AT OBLIQUE-INCIDENCE
NESTELL, JE
CHRISTY, RW
[J]. APPLIED OPTICS, 1972, 11 (03): : 643 - &
[7] DETERMINATION OF OPTICAL CONSTANTS FROM INTENSITY MEASUREMENTS AT NORMAL INCIDENCE
NILSSON, PO
[J]. APPLIED OPTICS, 1968, 7 (03): : 435 - &
[8] A NUMERICAL-METHOD FOR DETERMINING THE COMPLEX REFRACTIVE-INDEX FROM REFLECTANCE AND TRANSMITTANCE OF SUPPORTED THIN-FILMS
PHILLIPS, RT
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1983, 16 (04) : 489 - 497
[9] A THEORETICAL STUDY OF SENSITIVITIES OF SOME NORMAL INCIDENCE METHODS FOR MEASURING OPTICAL CONSTANTS AND THICKNESSES OF THIN FILMS
WARD, L
NAG, A
[J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1967, 18 (03): : 277 - &
[10] 1959, MATH TABLES HDB CHEM