ANALYTICAL USE OF PROTON-INDUCED X-RAY-EMISSION

被引：8

作者：

JOHANSSON, TB

AHLBERG, M

AKSELSSON, R

JOHANSSON, G

MALMQVIST, K

机构：

[1] LUND INST TECHNOL,DEPT NUCL PHYS,S-22362 LUND,SWEDEN

[2] UNIV LUND,DEPT ENVIRONM HLTH,S-22362 LUND,SWEDEN

来源：

JOURNAL OF RADIOANALYTICAL CHEMISTRY | 1976年 / 32卷 / 01期

关键词：

D O I：

10.1007/BF02517753

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：207 / 217

页数：11

共 18 条

[1] ELIMINATION OF CHARGING IN PROTON-INDUCED X-RAY-EMISSION ANALYSIS OF INSULATING SAMPLES [J].

AHLBERG, M ;

JOHANSSON, G ;

MALMQVIST, K .

NUCLEAR INSTRUMENTS & METHODS, 1975, 131 (02) :377-379

[2] PROTON-INDUCED X-RAY ANALYSIS OF STEEL SURFACES FOR MICROPROBE PURPOSES [J].

AHLBERG, M ;

AKSELSSON, R ;

BRUNE, D ;

LORENZEN, J .

NUCLEAR INSTRUMENTS & METHODS, 1975, 123 (02) :385-393

[3]

AHLBERG M, IN PRESS

[4]

AHLBERG MS, 1975, ARCHEOMETRY, V18, P39

[5]

Akselsson R., 1975, ADV XRAY ANALYSIS, V18, P588

[6]

AKSELSSON R, 1974, 2ND P INT C NUCL MET, P395

[7]

AKSELSSON R, 1975, 4TH INT S INH PART V

[8] TRACE-ELEMENT ANALYSIS OF FLUIDS BY PROTON-INDUCED X-RAY-FLUORESCENCE SPECTROMETRY [J].

CAMPBELL, JL ;

ORR, BH ;

HERMAN, AW ;

MCNELLES, LA ;

THOMSON, JA ;

COOK, WB .

ANALYTICAL CHEMISTRY, 1975, 47 (09) :1542-1553

[9] PROTON MICROBEAMS, THEIR PRODUCTION AND USE [J].

COOKSON, JA ;

FERGUSON, AT ;

PILLING, FD .

JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1972, 12 (01) :39-52

[10] PROTON-INDUCED X-RAY-EMISSION AS A TOOL FOR TRACE-ELEMENT ANALYSIS [J].

FOLKMANN, F ;

GAARDE, C ;

HUUS, T ;

KEMP, K .

NUCLEAR INSTRUMENTS & METHODS, 1974, 116 (03) :487-499

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