ELIMINATION OF CHARGING IN PROTON-INDUCED X-RAY-EMISSION ANALYSIS OF INSULATING SAMPLES

被引：64

作者：

AHLBERG, M ^{[1
]}

JOHANSSON, G ^{[1
]}

MALMQVIST, K ^{[1
]}

机构：

[1] LUND INST TECHNOL,DEPT NUCL PHYS,LUND,SWEDEN

来源：

NUCLEAR INSTRUMENTS & METHODS | 1975年 / 131卷 / 02期

关键词：

D O I：

10.1016/0029-554X(75)90344-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：377 / 379

页数：3

共 11 条

[1] PROTON-INDUCED X-RAY ANALYSIS OF STEEL SURFACES FOR MICROPROBE PURPOSES
AHLBERG, M
AKSELSSON, R
BRUNE, D
LORENZEN, J
[J]. NUCLEAR INSTRUMENTS & METHODS, 1975, 123 (02): : 385 - 393
[2] AHLBERG M, TO BE PUBLISHED
[3] PROTON-INDUCED X-RAY-EMISSION AS A TOOL FOR TRACE-ELEMENT ANALYSIS
FOLKMANN, F
GAARDE, C
HUUS, T
KEMP, K
[J]. NUCLEAR INSTRUMENTS & METHODS, 1974, 116 (03): : 487 - 499
[4] ELEMENTAL TRACE ANALYSIS OF SMALL SAMPLES BY PROTON-INDUCED X-RAY-EMISSION
JOHANSSON, TB
VANGRIEKEN, RE
NELSON, JW
WINCHESTER, JW
[J]. ANALYTICAL CHEMISTRY, 1975, 47 (06) : 855 - 860
[5] X-RAY ANALYSIS - ELEMENTAL TRACE ANALYSIS AT 10-12G LEVEL
JOHANSSON, TB
AKSELSSON, R
JOHANSSON, SA
[J]. NUCLEAR INSTRUMENTS & METHODS, 1970, 84 (01): : 141 - +
[6] JOHANSSON TB, 1972, ADVANCES XRAY ANALYS, V15, P373
[7] JOPSON RC, 1963, PHYS REV, V127, P1613
[8] LEYDEN DE, 1975, INT LABORATORY JAN, P26
[9] DETERMINATION OF FLUORIDE CONCENTRATION PROFILE IN TOOTH ENAMEL USING A NUCLEAR-RESONANCE TECHNIQUE
MANDLER, JW
MOLER, RB
RAISEN, E
RAJAN, KS
[J]. THIN SOLID FILMS, 1973, 19 (01) : 165 - 172
[10] QUANTITATIVE TRACE-ELEMENT ANALYSES IN THICK SAMPLES WITH HEAVY-ION-INDUCED X-RAY-FLUORESCENCE
SHABASON, L
COHEN, BL
WEDBERG, GH
CHAN, KC
[J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (10) : 4749 - 4752