MULTIPLY CHARGED METAL-ION BEAMS

被引：20

作者：

BROWN, IG

GALVIN, JE

MACGILL, RA

WEST, MW

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1989年 / 43卷 / 03期

关键词：

D O I：

10.1016/0168-583X(89)90389-3

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：455 / 458

页数：4

共 10 条

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[8] ION-BEAM PROFILE MONITOR [J].

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[9]

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[10] THE ELECTRON-BEAM ION TRAP - A NEW INSTRUMENT FOR ATOMIC PHYSICS MEASUREMENTS [J].

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