OPTIMAL GRANULARITY AND SCHEME OF PARALLEL TEST-GENERATION IN A DISTRIBUTED SYSTEM

被引：7

作者：

FUJIWARA, H

INOUE, T

机构：

[1] Graduate School of Information Science, Nara Institute of Science and Technology, Ikoma

来源：

IEEE TRANSACTIONS ON PARALLEL AND DISTRIBUTED SYSTEMS | 1995年 / 6卷 / 07期

关键词：

COMBINATIONAL CIRCUITS; CLIENT-SERVER MODEL; DISTRIBUTED SYSTEMS; FAULT SIMULATION; GRANULARITY; PARALLEL PROCESSING; TEST GENERATION;

D O I：

10.1109/71.395397

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

A Client-Agent-Server model (GAS model) which can decrease the work load of the client by adding agent processors to the Client-Server model (CS model) is proposed and an approach to parallel test generation for logic circuits on the CAS model is presented. Two problems are considered: optimal granularity problem and optimal scheme problem. First, the problem of parallel test generation on the CAS model is formulated to analyze the effect of the granularity (grain size of target faults allocated to processors) in both cases of static and dynamic task allocation (optimal granularity problem), Then the relationship between the number of processors and the total processing time is analyzed (optimal scheme problem). From the analysis, it is shown that the CAS model can reduce the total processing time over the CS model and that there exists an optimal scheme (an optimal pair of numbers of agent processors and server processors) for the CAS model which minimizes the total processing time for a given number of processors. To corroborate the analysis, the proposed parallel test generation algorithm is implemented on a network of more than 100 workstations and experimental results for the ISCAS benchmark circuits are presented. It is shown that the experimental results are very dose to the theoretical results which confirms the existence of optimal granularity and optimal scheme which minimizes the total processing time for the CAS model.

引用

页码：677 / 686

页数：10

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