OBSERVATION OF SURFACE-DIFFUSION BY BIASED SECONDARY-ELECTRON IMAGING - THE CASE OF AG/W(110)

被引：15

作者：

JONES, GW ^{[1
]}

VENABLES, JA ^{[1
]}

机构：

[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287

来源：

ULTRAMICROSCOPY | 1985年 / 18卷 / 1-4期

关键词：

D O I：

10.1016/0304-3991(85)90163-9

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：439 / 444

页数：6

共 18 条

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[8] NUCLEATION, GROWTH AND THE INTERMEDIATE LAYER IN AG/SI(100) AND AG SI(111) [J].

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[10] DIGITAL DATA ACQUISITION, DISPLAY AND ANALYSIS OF SIGNALS FROM SURFACES [J].

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