TEMPERATURE-DEPENDENT RESISTIVITY MEASUREMENTS ON POLYCRYSTALLINE SIO2-COVERED THIN NICKEL FILMS

被引：17

作者：

DEVRIES, JWC

机构：

来源：

关键词：

D O I：

10.1016/0040-6090(87)90092-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：209 / 215

页数：7

共 11 条

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[7] SAMBLES JR, 1983, THIN SOLID FILMS, V106, P321, DOI 10.1016/0040-6090(83)90344-9
[8] ELECTRICAL-CONDUCTION IN METAL FOILS
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[J]. JOURNAL OF PHYSICS F-METAL PHYSICS, 1980, 10 (07): : 1487 - 1494
[9] GRAIN-BOUNDARY ELECTRON-SCATTERING EFFECT ON METAL-FILM RESISTIVITY
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