PRECISE MEASUREMENTS OF POSITRON-HELIUM TOTAL CROSS-SECTIONS FROM 0.6 TO 22 EV

被引:61
作者
MIZOGAWA, T
NAKAYAMA, Y
KAWARATANI, T
TOSAKI, M
机构
来源
PHYSICAL REVIEW A | 1985年 / 31卷 / 04期
关键词
D O I
10.1103/PhysRevA.31.2171
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
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页码:2171 / 2179
页数:9
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[1]   ELASTIC-SCATTERING OF SLOW POSITRONS BY HELIUM [J].
AMUSIA, MY ;
CHEREPKOV, NA ;
CHERNYSHEVA, LV ;
SHAPIRO, SG .
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1976, 9 (17) :L531-L534
[2]   THERMAL TRANSPIRATION ERROR IN ABSOLUTE PRESSURE MEASUREMENT WITH CAPACITANCE MANOMETERS [J].
BALDWIN, GC ;
GAERTTNER, MR .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (01) :215-217
[3]   POSITRON-HELIUM SCATTERING CROSS-SECTIONS AT LOW ENERGIES [J].
BURCIAGA, JR ;
COLEMAN, PG ;
DIANA, LM ;
MCNUTT, JD .
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1977, 10 (15) :L569-L572
[4]   SCATTERING OF S-WAVE POSITRONS BY HELIUM [J].
CAMPEANU, RI ;
HUMBERSTON, JW .
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1977, 10 (05) :L153-L158
[5]   MEASUREMENT OF TOTAL CROSS-SECTIONS FOR POSITRONS OF ENERGIES 2-400 EV IN HE, NE, AR, AND KR [J].
CANTER, KF ;
COLEMAN, PG ;
GRIFFITH, TC ;
HEYLAND, GR .
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1973, 6 (08) :L201-L203
[6]   ANALYSIS OF DATA OBTAINED WITH TIME TO AMPLITUDE CONVERTER AND MULTICHANNEL ANALYZER SYSTEMS [J].
COLEMAN, PG ;
GRIFFITH, TC ;
HEYLAND, GR .
APPLIED PHYSICS, 1974, 5 (03) :223-230
[7]   (E+, HE) TOTAL SCATTERING [J].
COSTELLO, DG ;
MCGOWAN, JW ;
HERRING, DF ;
GROCE, DE .
CANADIAN JOURNAL OF PHYSICS, 1972, 50 (01) :23-&
[8]   NEW TECHNIQUE FOR THRESHOLD EXCITATION SPECTROSCOPY [J].
CVEJANOVIC, S ;
READ, FH .
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1974, 7 (10) :1180-1193
[9]   THEORY OF LOW-ENERGY POSITRON-HELIUM SCATTERING [J].
DRACHMAN, RJ .
PHYSICAL REVIEW, 1966, 144 (01) :25-&
[10]   A STUDY OF THERMAL TRANSPIRATION USING ULTRAHIGH-VACUUM TECHNIQUES [J].
EDMONDS, T ;
HOBSON, JP .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1965, 2 (04) :182-&