HIGH-PRESSURE AND EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE STUDY OF CR-RICH CR-GE ALLOYS

被引：15

作者：

MUNCH, R

HOCHHEIMER, HD

WERNER, A

MATERLIK, G

JAYARAMAN, A

RAO, KV

机构：

[1] DESY,HAMBURGER SYNCHROTRONSTRAHLUNGSLAB,D-2000 HAMBURG 52,FED REP GER

[2] BELL TEL LABS INC,MURRAY HILL,NJ 07974

[3] THREE M CO,E&IT SECTOR LABS,ST PAUL,MN 55133

来源：

PHYSICAL REVIEW LETTERS | 1983年 / 50卷 / 20期

关键词：

D O I：

10.1103/PhysRevLett.50.1619

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1619 / 1622

页数：4

共 16 条

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[4] NEUTRON-DIFFRACTION STUDY OF CHROMIUM-GERMANIUM ALLOYS
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[6] EXTENDED X-RAY ABSORPTION FINE-STRUCTURE - ITS STRENGTHS AND LIMITATIONS AS A STRUCTURAL TOOL
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[7] SITING AND DYNAMICS OF CU IMPURITY IN TI LATTICE
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[8] IMPROVED EXTENDED-X-RAY-ABSORPTION FINE-STRUCTURE (EXAFS) STUDIES APPLIED TO INVESTIGATION OF CU-O, CU-N, AND CU-BR BOND LENGTHS
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[9] EXTENDED X-RAY-ABSORBTION FINE-STRUCTURE BEATS - NEW METHOD TO DETERMINE DIFFERENCES IN BOND LENGTHS
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RABE, P
SCHWENTNER, N
WERNER, A
[J]. PHYSICAL REVIEW LETTERS, 1977, 39 (22) : 1411 - 1414
[10] MUNCH R, 1983, THESIS U STUTTGART

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