MULTIPLE-WAVELENGTH PHASE-SHIFTING INTERFEROMETRY

被引:270
作者
CHENG, YY
WYANT, JC
机构
关键词
D O I
10.1364/AO.24.000804
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:804 / 807
页数:4
相关论文
共 6 条
[1]  
Bruning J.H., 1978, OPTICAL SHOP TESTING
[2]   2-WAVELENGTH PHASE-SHIFTING INTERFEROMETRY [J].
CHENG, YY ;
WYANT, JC .
APPLIED OPTICS, 1984, 23 (24) :4539-4543
[3]  
KOLIOPOULOS C, 1981, THESIS U ARIZONA
[4]   2-WAVELENGTH INTERFEROMETRY [J].
POLHEMUS, C .
APPLIED OPTICS, 1973, 12 (09) :2071-2074
[5]   DIGITAL WAVE-FRONT MEASURING INTERFEROMETRY - SOME SYSTEMATIC-ERROR SOURCES [J].
SCHWIDER, J ;
BUROW, R ;
ELSSNER, KE ;
GRZANNA, J ;
SPOLACZYK, R ;
MERKEL, K .
APPLIED OPTICS, 1983, 22 (21) :3421-3432
[6]   TESTING ASPHERICS USING WAVELENGTH HOLOGRAPHY [J].
WYANT, JC .
APPLIED OPTICS, 1971, 10 (09) :2113-&