EXCITATIONS AT INTERFACES AND SMALL PARTICLES

被引:109
作者
HOWIE, A
MILNE, RH
机构
[1] Cavendish Lab, Cambridge, Engl, Cavendish Lab, Cambridge, Engl
关键词
ELECTRONS; -; Emission; MICROSCOPES; ELECTRON - SEMICONDUCTING GALLIUM ARSENIDE - SPECTROSCOPY; SPECTROSCOPY; ELECTRON;
D O I
10.1016/0304-3991(85)90161-5
中图分类号
TH742 [显微镜];
学科分类号
摘要
Recent STEM results on valence electron excitation and secondary electron emission from small particles are presented. Classical dielectric theory seems to be capable of explaining many of the observations even at quite high spatial resolution. Improved sensitivity to genuine interfacial structure could be achieved in experiments at larger scattering angles. The secondary electron images demonstrate quite high spatial resolution but appear to be influenced by local charging effects.
引用
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页码:427 / 434
页数:8
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