DETECTION EFFICIENCY OF FLARED-TYPE MICRO CHANNELPLATES APPLIED FOR TOF ATOM-PROBE FIM

被引:4
作者
HASEGAWA, Y [1 ]
HASHIZUME, T [1 ]
SAKURAI, T [1 ]
MIZUSHIMA, Y [1 ]
机构
[1] HAMATSU PHOTON KK,HAMAMATSU,JAPAN
来源
JOURNAL DE PHYSIQUE | 1986年 / 47卷 / C-7期
关键词
D O I
10.1051/jphyscol:1986785
中图分类号
学科分类号
摘要
引用
收藏
页码:509 / 513
页数:5
相关论文
共 11 条
[1]  
GALANTI M, 1971, REV SCI INSTRUM, V42, P1818
[2]   ABSOLUTE AND ANGULAR EFFICIENCIES OF A MICROCHANNEL-PLATE POSITION-SENSITIVE DETECTOR [J].
GAO, RS ;
GIBNER, PS ;
NEWMAN, JH ;
SMITH, KA ;
STEBBINGS, RF .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1984, 55 (11) :1756-1759
[3]  
GARUGANTHU RR, 1984, REV SCI INSTRUM, V55, P2030
[4]   THE ABSOLUTE DETECTION EFFICIENCY OF A CHANNELPLATE ELECTRON MULTIPLIER [J].
HASHIZUME, T ;
SAKURAI, T .
JOURNAL DE PHYSIQUE, 1986, 47 (C-2) :425-430
[5]  
KENNERLY RE, 1982, REV SCI INSTRUM, V48, P1682
[6]   REVIEW OF INFLUENCE OF RADIATIONS ON CHANNELTRONS AND CHANNEL PLATES [J].
MACAU, JP ;
JAMAR, J ;
GARDIER, S .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1976, 23 (06) :2049-2055
[7]  
NISHIKAWA O, 1986, J PHYS-PARIS, V47, P303
[8]   AREAL DETECTION EFFICIENCY OF CHANNEL ELECTRON MULTIPLIER ARRAYS [J].
PANITZ, JA ;
FOESCH, JA .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1976, 47 (01) :44-49
[9]   HIGH-PERFORMANCE, FOCUSING-TYPE, TIME-OF-FLIGHT ATOM PROBE WITH A CHANNELTRON AS A SIGNAL DETECTOR [J].
SAKURAI, T ;
HASHIZUME, T ;
JIMBO, A .
APPLIED PHYSICS LETTERS, 1984, 44 (01) :38-40
[10]   DETERMINATION OF THE DETECTION EFFICIENCY OF A CHANNELPLATE ELECTRON MULTIPLIER [J].
SAKURAI, T ;
HASHIZUME, T .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (02) :236-239