FIELD ION-SCANNING TUNNELING MICROSCOPY

被引：172

作者：

SAKURAI, T ^{[1
]}

HASHIZUME, T ^{[1
]}

KAMIYA, I ^{[1
]}

HASEGAWA, Y ^{[1
]}

SANO, N ^{[1
]}

PICKERING, HW ^{[1
]}

SAKAI, A ^{[1
]}

机构：

[1] TOHOKU UNIV,INST MAT RES,AOBA KU,SENDAI,MIYAGI 980,JAPAN

来源：

PROGRESS IN SURFACE SCIENCE | 1990年 / 33卷 / 01期

关键词：

D O I：

10.1016/0079-6816(90)90012-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A scanning tunneling microscope combined with a field ion microscope, which we call "FI-STM" has been constructed and tested successfully. The details of the principles and performance of the FI-STM are described. Several examples of its applications for Si (111) and Si (100) surfaces are presented as illustrations of the power of the instrument. © 1990.

引用

页码：3 / 89

页数：87

共 115 条

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