PRESSURE-DEPENDENCE OF THE RELATIVISTIC RISE IN NEON AND HIGHEST ATTAINABLE IONIZATION SAMPLING RESOLUTION IN NEON, ARGON, ETHYLENE AND PROPANE

被引：9

作者：

LEHRAUS, I

MATTHEWSON, R

TEJESSY, W

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1983年 / 30卷 / 01期

关键词：

D O I：

10.1109/TNS.1983.4332218

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：50 / 59

页数：10

共 14 条

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[7] PERFORMANCE OF A LARGE-SCALE MULTILAYER IONIZATION DETECTOR AND ITS USE FOR MEASUREMENTS OF RELATIVISTIC RISE IN MOMENTUM RANGE OF 20-110 GEV-C [J].

LEHRAUS, I ;

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[8] DE/DX MEASUREMENTS IN NE, AR, KR, XE AND PURE HYDROCARBONS [J].

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[9] PARTICLE IDENTIFICATION BY DE DX SAMPLING IN HIGH-PRESSURE DRIFT DETECTORS [J].

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