学术探索
学术期刊
新闻热点
数据分析
智能评审

RHEED AND REM STUDY OF SI(111) SURFACE DEGRADATION UNDER AR BOMBARDMENT

被引：7
作者：
CLAVERIE, A
FAURE, J
VIEU, C
BEAUVILLAIN, J
JOUFFREY, B
机构：
来源：
JOURNAL DE PHYSIQUE | 1986年 / 47卷 / 10期
关键词：
D O I：
10.1051/jphys:0198600470100180500
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：1805 / 1812
页数：8
相关论文
共 27 条
[1]   DOUBLE TILT HEATING SPECIMEN HOLDER FOR SURFACE IMAGING BY REFLECTION ELECTRON-MICROSCOPY USING AN EM-300 PHILIPS MICROSCOPE [J].
BEAUVILLAIN, J ;
CLAVERIE, A ;
JOUFFREY, B .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1985, 56 (03) :418-420
[2]  
BEAUVILLAIN J, 1984, J MICROSC SPECT ELEC, V9, P431
[3]  
Brice D. K., 1970, Radiation Effects, V6, P77, DOI 10.1080/00337577008235048
[4]  
CHOUIYAKH M, 1984, THESIS STRASBOURG
[5]   THE IMAGE-CONTRAST OF SURFACE STEPS IN REFLECTION ELECTRON-MICROSCOPY [J].
COWLEY, JM ;
PENG, L .
ULTRAMICROSCOPY, 1985, 16 (01) :59-67
[6]   CRYSTALLINE TO AMORPHOUS TRANSFORMATION IN ION-IMPLANTED SILICON - COMPOSITE MODEL [J].
DENNIS, JR ;
HALE, EB .
JOURNAL OF APPLIED PHYSICS, 1978, 49 (03) :1119-1127
[7]  
DENNIS JR, 1975, I PHYS C SER, V23, P467
[8]  
DENNIS JR, 1976, APPL PHYS LETT, V29, P9
[9]  
GIBBONS JF, 1968, P IEEE, V56, P3
[10]  
GIBBONS JF, 1972, P IEEE, V60, P9
123