TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS OF LIGHT-ELEMENTS UNDER VARIOUS EXCITATION CONDITIONS

Total reflection x-ray fluorescence (TXRF) analysis was tested for its suitability for the photon-induced energy dispersive analysis of light elements such as B, C, N, O, F, Na and Mg using a special spectrometer meeting tbe requirements for the detection of low-energy fluorescence radiation. The influence of different spectral modification devices such as a high-energy cut-off reflector and a multilayer monochromator were compared using excitation by a Cr tube and also synchrotron radiation. The effects on intensity, background and detection limits are compared and discussed. A new method of monitoring the x-ray beam to adjust total reflection by a CCD camera is introduced. Considerations on the penetration depth and information depth of light elements are presented.