DUAL EXCIMER AND CO2-LASER ETCHING STUDIES OF POLYETHYLENE TEREPHTHALATE

被引：12

作者：

ALDHAHIR, RK ^{[1
]}

DYER, PE ^{[1
]}

SIDHU, J ^{[1
]}

FOULKESWILLIAMS, C ^{[1
]}

OLDERSHAW, GA ^{[1
]}

机构：

[1] UNIV HULL,SCH CHEM,HULL HU6 7RX,N HUMBERSIDE,ENGLAND

来源：

APPLIED PHYSICS B-PHOTOPHYSICS AND LASER CHEMISTRY | 1989年 / 49卷 / 05期

关键词：

D O I：

10.1007/BF00325346

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：435 / 440

页数：6

共 12 条

[1] DIRECT ETCHING OF POLYMERIC MATERIALS USING A XECL LASER
ANDREW, JE
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FORSTER, D
KEY, PH
[J]. APPLIED PHYSICS LETTERS, 1983, 43 (08) : 717 - 719
[2] LOW-TEMPERATURE UV LASER ETCHING OF PMMA - ON THE MECHANISM OF ABLATIVE PHOTODECOMPOSITION (APD)
BRAREN, B
SEEGER, D
[J]. JOURNAL OF POLYMER SCIENCE PART C-POLYMER LETTERS, 1986, 24 (08) : 371 - 376
[3] PHOTOCHEMICAL DEGRADATION OF POLY(ETHYLENE TEREPHTHALATE) .2. EFFECT OF WAVELENGTH AND ENVIRONMENT ON DECOMPOSITION PROCESS
DAY, M
WILES, DM
[J]. JOURNAL OF APPLIED POLYMER SCIENCE, 1972, 16 (01) : 191 - &
[4] EXCIMER LASER ABLATION AND THERMAL COUPLING EFFICIENCY TO POLYMER-FILMS
DYER, PE
SIDHU, J
[J]. JOURNAL OF APPLIED PHYSICS, 1985, 57 (04) : 1420 - 1422
[5] NANOSECOND PHOTOACOUSTIC STUDIES ON ULTRAVIOLET-LASER ABLATION OF ORGANIC POLYMERS
DYER, PE
SRINIVASAN, R
[J]. APPLIED PHYSICS LETTERS, 1986, 48 (06) : 445 - 447
[6] GENERATION AND DETECTION OF 160-MHZ ACOUSTIC-WAVES USING A TEA CO2-LASER IRRADIATED POLYMER FILM COMBINATION
DYER, PE
SIDHU, J
TAIT, BL
[J]. IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 1988, 35 (01) : 2 - 4
[7] DYER PE, THM11 CLEO PAP
[8] KOREN G, 1984, APPL PHYS LETT, V45, P11
[9] PHOTOLYSIS OF POLY(ETHYLENE TEREPHTHALATE)
MARCOTTE, FB
CAMPBELL, D
CLEAVELA.JA
TURNER, DT
[J]. JOURNAL OF POLYMER SCIENCE PART A-1-POLYMER CHEMISTRY, 1967, 5 (3PA1): : 481 - +
[10] MECHANISM OF THE ULTRAVIOLET-LASER ABLATION OF POLY(METHYL METHACRYLATE AT 193 AND 248 NM - LASER-INDUCED FLUORESCENCE ANALYSIS, CHEMICAL-ANALYSIS, AND DOPING STUDIES
SRINIVASAN, R
BRAREN, B
DREYFUS, RW
HADEL, L
SEEGER, DE
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1986, 3 (05) : 785 - 791

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