NATURE OF DEFECTS IN AMORPHOUS GE-S AND SI-N

被引：15

作者：

SHIMIZU, T

机构：

[1] Kanazawa Univ, Dep of Electronics,, Kanazawa, Jpn, Kanazawa Univ, Dep of Electronics, Kanazawa, Jpn

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1985年 / 71卷 / 1-3期

关键词：

AMORPHOUS SILICON-BASED FILMS - CHALCOGENIDE GLASSES - EFFECTIVE ELECTRON CORRELATION ENERGIES;

D O I：

10.1016/0022-3093(85)90283-2

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：145 / 155

页数：11

共 35 条

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