USE OF AUGER SPECTROMETRY TO CHARACTERIZE ANODIC FILMS FORMED ON ALUMINUM

[1] X-RAY-FLUORESCENCE ANALYSIS OF PHOSPHORUS INCORPORATED IN ANODIC ALUMINUM AND NIOBIUM FILMS FORMED IN PHOSPHORIC-ACID SOLUTION [J]. MATERIALS RESEARCH BULLETIN, 1976, 11 (05) : 525 - 532

[2] THE REACTION BETWEEN ANODIC ALUMINUM OXIDE AND WATER [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1961, 108 (09) : 822 - 825

[3] DORSEY GA, 1972, J ELECTROCHEM SOC, V113, P172

[4] HAUSER V, 1958, REV SCI I, V29, P380

[5] Hedman J., 1972, PHYS SCRIPTA, V5, P93, DOI [10.1088/0031-8949/5/1-2/015, DOI 10.1088/0031-8949/5/1-2/015]

[6] SIMULTANEOUS OBSERVATIONS OF PARTIALLY OXIDIZED SURFACES BY AES AND SIMS FOR AL, SI, TI, V, AND CR [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 361 - 365

[7] LICHTENBERGER E, 1961, METALLOBERFLACHE, V15, P38

[8] APPLICATION OF AUGER-ELECTRON SPECTROSCOPY TO DETERMINATION OF COMPOSITION OF PASSIVE FILMS ON TYPE 316 SS [J]. SCRIPTA METALLURGICA, 1972, 6 (12): : 1205 - 1208

[9] MORPHOLOGY AND MECHANISM OF FORMATION OF POROUS ANODIC FILMS ON ALUMINIUM [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1970, 317 (1531) : 511 - +

[10] USE OF AUGER-ELECTRON SPECTROSCOPY AND INERT-GAS SPUTTERING FOR OBTAINING CHEMICAL PROFILES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1972, 9 (01): : 160 - &

[1] X-RAY-FLUORESCENCE ANALYSIS OF PHOSPHORUS INCORPORATED IN ANODIC ALUMINUM AND NIOBIUM FILMS FORMED IN PHOSPHORIC-ACID SOLUTION [J]. MATERIALS RESEARCH BULLETIN, 1976, 11 (05) : 525 - 532

[2] THE REACTION BETWEEN ANODIC ALUMINUM OXIDE AND WATER [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1961, 108 (09) : 822 - 825

[3] DORSEY GA, 1972, J ELECTROCHEM SOC, V113, P172

[4] HAUSER V, 1958, REV SCI I, V29, P380

[5] Hedman J., 1972, PHYS SCRIPTA, V5, P93, DOI [10.1088/0031-8949/5/1-2/015, DOI 10.1088/0031-8949/5/1-2/015]

[6] SIMULTANEOUS OBSERVATIONS OF PARTIALLY OXIDIZED SURFACES BY AES AND SIMS FOR AL, SI, TI, V, AND CR [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 361 - 365

[7] LICHTENBERGER E, 1961, METALLOBERFLACHE, V15, P38

[8] APPLICATION OF AUGER-ELECTRON SPECTROSCOPY TO DETERMINATION OF COMPOSITION OF PASSIVE FILMS ON TYPE 316 SS [J]. SCRIPTA METALLURGICA, 1972, 6 (12): : 1205 - 1208

[9] MORPHOLOGY AND MECHANISM OF FORMATION OF POROUS ANODIC FILMS ON ALUMINIUM [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1970, 317 (1531) : 511 - +

[10] USE OF AUGER-ELECTRON SPECTROSCOPY AND INERT-GAS SPUTTERING FOR OBTAINING CHEMICAL PROFILES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1972, 9 (01): : 160 - &