CALIBRATION OF THE HARWELL SERIES-II BI-IMPLANTED RBS STANDARDS

被引:29
作者
DAVIES, JA
JACKMAN, TE
ESCHBACH, HL
DOBMA, W
WATJEN, U
CHIVERS, D
机构
[1] AERE,HARWELL OX11 0RA,OXON,ENGLAND
[2] CENT BUR NUCL MEASUREMENTS,GEEL,BELGIUM
关键词
D O I
10.1016/0168-583X(86)90293-4
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:238 / 240
页数:3
相关论文
共 8 条
  • [1] LARGE-ANGLE SCATTERING OF LIGHT-IONS IN THE WEAKLY SCREENED RUTHERFORD REGION
    ANDERSEN, HH
    BESENBACHER, F
    LOFTAGER, P
    MOLLER, W
    [J]. PHYSICAL REVIEW A, 1980, 21 (06): : 1891 - 1901
  • [2] BAGLIN J, 1975, 2ND P INT ION BEAM A, P313
  • [3] INTERCOMPARISON OF ABSOLUTE STANDARDS FOR RBS STUDIES
    COHEN, C
    DAVIES, JA
    DRIGO, AV
    JACKMAN, TE
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3): : 147 - 148
  • [4] CORRECTION OF THE RUTHERFORD SCATTERING CROSS-SECTION IN THE BACKSCATTERING ANALYSIS
    HAUTALA, M
    LUOMAJARVI, M
    [J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1980, 45 (3-4): : 159 - 162
  • [5] HOW ACCURATE ARE ABSOLUTE RUTHERFORD BACKSCATTERING YIELDS
    LECUYER, J
    DAVIES, JA
    MATSUNAMI, N
    [J]. NUCLEAR INSTRUMENTS & METHODS, 1979, 160 (02): : 337 - 346
  • [6] CHARACTERIZATION OF A NEW BATCH OF ION-IMPLANTED BI IN SILICON SPECIMENS FOR USE AS PRIMARY REFERENCE SURFACE STANDARDS
    MITCHELL, IV
    ESCHBACH, HL
    AVALDI, L
    DOBMA, W
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3): : 91 - 96
  • [7] STANDARDS FOR BACKSCATTERING ANALYSIS
    MITCHELL, IV
    ESCHBACH, HL
    [J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 727 - 733
  • [8] RIGO S, 1978, NUCL INSTR METH, V149, P727