ANALYSIS OF IMPREGNATED CHARCOALS BY DESORPTION IONIZATION MASS-SPECTROMETRY

被引：18

作者：

ROSS, MM

KIDWELL, DA

CAMPANA, JE

机构：

来源：

ANALYTICAL CHEMISTRY | 1984年 / 56卷 / 12期

关键词：

D O I：

10.1021/ac00276a037

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：2142 / 2145

页数：4

共 23 条

[1] BASE PEAK PROFILES OF GAS CHROMATOGRAPHY-MASS SPECTROMETRIC DATA OBTAINED FROM THERMAL-DESORPTION OF ACTIVATED CARBONS [J].

ALBEN, K .

ANALYTICAL CHEMISTRY, 1980, 52 (12) :1821-1824

[2]

BARBER M, 1982, ANAL CHEM, V54, pA645

[3] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS) [J].

BENNINGHOVEN, A .

SURFACE SCIENCE, 1973, 35 (01) :427-457

[4] DESORPTION IONIZATION MASS-SPECTROMETRY - SAMPLE PREPARATION FOR SECONDARY ION MASS-SPECTROMETRY, LASER DESORPTION, AND FIELD DESORPTION [J].

BUSCH, KL ;

UNGER, SE ;

VINCZE, A ;

COOKS, RG ;

KEOUGH, T .

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1982, 104 (06) :1507-1511

[5]

CAMPANA JE, 1983, ION FORMATION ORGANI, P144

[6] HIGH-PERFORMANCE SECONDARY ION MASS-SPECTROMETER [J].

COLTON, RJ ;

CAMPANA, JE ;

BARLAK, TM ;

DECORPO, JJ ;

WYATT, JR .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1980, 51 (12) :1685-1689

[7] MOLECULAR SECONDARY ION MASS-SPECTROMETRY (SIMS) [J].

COLTON, RJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (03) :737-747

[8] ENERGY DEPOSITION IN DESORPTION IONIZATION [J].

COOK, KD ;

CHAN, KWS .

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 54 (1-2) :135-149

[9] LASER MASS-SPECTROMETRY OF DIQUATERNARY AMMONIUM-SALTS [J].

DANG, TA ;

DAY, RJ ;

HERCULES, DM .

ANALYTICAL CHEMISTRY, 1984, 56 (06) :866-871

[10] FORMATION OF METAL-CHELATES IN SECONDARY ION MASS-SPECTROMETRY - COMPARISONS WITH SOLUTION CHEMISTRY [J].

DAY, RJ ;

UNGER, SE ;

COOKS, RG .

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1979, 101 (02) :499-501

← 1 2 3 →