RAY TRACING OF CURVED-CRYSTAL X-RAY OPTICS FOR SPECTROSCOPY ON FAST ION-BEAMS

被引：18

作者：

BEYER, HF

LIESEN, D

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1988年 / 272卷 / 03期

关键词：

D O I：

10.1016/0168-9002(88)90777-2

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：895 / 905

页数：11

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