RAY TRACING OF CURVED-CRYSTAL X-RAY OPTICS FOR SPECTROSCOPY ON FAST ION-BEAMS

被引:18
作者
BEYER, HF
LIESEN, D
机构
关键词
D O I
10.1016/0168-9002(88)90777-2
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:895 / 905
页数:11
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