MEASUREMENT OF REAL-TIME DIGITAL SIGNALS IN A SILICON BIPOLAR JUNCTION TRANSISTOR USING A NONINVASIVE OPTICAL PROBE

被引：27

作者：

HEINRICH, HK

HEMENWAY, BR

MCGRODDY, KA

BLOOM, DM

机构：

来源：

ELECTRONICS LETTERS | 1986年 / 22卷 / 12期

关键词：

D O I：

10.1049/el:19860445

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：650 / 652

页数：3

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