ELECTRON-BEAM TESTING - METHODS AND APPLICATIONS

[1] BALK LJ, 1976, SCANNING ELECTRON MI, V1, P615

[2] BEHERA SK, 1972, 10 ANN P REL PHYS, P5

[3] CRICHTON G, 1981, GROSSINTEGRATION, V77, P99

[4] CRICHTON G, 1980, IEEE TEST C, P444

[5] Crosthwait D. L., 1974, Scanning Electron Microscopy 1974, P935

[6] PULSED PHOTOMULTIPLIERS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (09) : 1158 - &

[7] DRIVER MC, 1969, SCANNING ELECTRON MI, P403

[8] EVALUATION OF PASSIVATED INTEGRATED CIRCUITS USING THE SCANNING ELECTRON MICROSCOPE [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1964, 111 (08) : 929 - 936

[9] FAZEKAS P, 1982, COMMUNICATION

[10] FAZEKAS P, 1981, ELECTRONICS, V14, P105

[1] BALK LJ, 1976, SCANNING ELECTRON MI, V1, P615

[2] BEHERA SK, 1972, 10 ANN P REL PHYS, P5

[3] CRICHTON G, 1981, GROSSINTEGRATION, V77, P99

[4] CRICHTON G, 1980, IEEE TEST C, P444

[5] Crosthwait D. L., 1974, Scanning Electron Microscopy 1974, P935

[6] PULSED PHOTOMULTIPLIERS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (09) : 1158 - &

[7] DRIVER MC, 1969, SCANNING ELECTRON MI, P403

[8] EVALUATION OF PASSIVATED INTEGRATED CIRCUITS USING THE SCANNING ELECTRON MICROSCOPE [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1964, 111 (08) : 929 - 936

[9] FAZEKAS P, 1982, COMMUNICATION

[10] FAZEKAS P, 1981, ELECTRONICS, V14, P105