ELECTRON-BEAM TESTING - METHODS AND APPLICATIONS

[31] Menzel E., 1979, Scanning Electron Microscopy, P305

[32] MENZEL E, 1981, SCAN ELECTRON MICROS, P305

[33] Nicolas D. P., 1974, Scanning Electron Microscopy 1974, P955

[34] ISOLATION OF POTENTIAL CONTRAST IN SCANNING ELECTRON MICROSCOPE [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (08): : 742 - &

[35] Ostrow M., 1981, MICROCIRCUIT ENG, P514

[36] STROBOSCOPIC SCANNING ELECTRON MICROSCOPY [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (06): : 595 - &

[37] REHME H, 1983, HALBLEITERELEKTRONIK, V16

[38] STROBOSCOPIC SCANNING ELECTRON MICROSCOPY AT GIGAHERTZ FREQUENCIES [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (02) : 251 - &

[39] RODMAN IK, 1980, SOLID ST ELECTRON, V23, P1029

[40] Thomas P. R., 1976, Scanning Electron Microscopy 1976. I, P609

[31] Menzel E., 1979, Scanning Electron Microscopy, P305

[32] MENZEL E, 1981, SCAN ELECTRON MICROS, P305

[33] Nicolas D. P., 1974, Scanning Electron Microscopy 1974, P955

[34] ISOLATION OF POTENTIAL CONTRAST IN SCANNING ELECTRON MICROSCOPE [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (08): : 742 - &

[35] Ostrow M., 1981, MICROCIRCUIT ENG, P514

[36] STROBOSCOPIC SCANNING ELECTRON MICROSCOPY [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (06): : 595 - &

[37] REHME H, 1983, HALBLEITERELEKTRONIK, V16

[38] STROBOSCOPIC SCANNING ELECTRON MICROSCOPY AT GIGAHERTZ FREQUENCIES [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (02) : 251 - &

[39] RODMAN IK, 1980, SOLID ST ELECTRON, V23, P1029

[40] Thomas P. R., 1976, Scanning Electron Microscopy 1976. I, P609