ABSENCE OF NEGATIVE-ION EFFECTS DURING ON-AXIS SINGLE TARGET SPUTTER DEPOSITIONS OF Y-BA-CU-O THIN-FILMS ON SI (100)

被引:26
作者
MIGLIUOLO, M
BELAN, RM
BREWER, JA
机构
关键词
D O I
10.1063/1.102845
中图分类号
O59 [应用物理学];
学科分类号
摘要
Stoichiometric thin films of YBa2Cu3O 7-δ have been deposited on (100) silicon substrates by on-axis single target magnetron sputtering. The effect of oxygen resputtering was minimized through the use of much stronger than usual magnetic assemblies in the source. A magnet assembly incorporating NdB and NdFeB magnets produced a magnetic field above the target twice as large as the one produced by a standard SmCo magnet assembly. This allows for the use of lower operating voltages and a better electron racetrack confinement, resulting in little or no oxygen resputtering. We have obtained stoichiometric or near-stoichiometric films on silicon both by dc and rf magnetron techniques at a variety of sputtering pressures and target to substrate distances.
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页码:2572 / 2574
页数:3
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