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CORRELATION OF SERS INTENSITY POTENTIAL PROFILES WITH ADSORPTION DESORPTION PEAKS OF PYRIDINE ON AU
被引:18
作者
:
BALTRUSCHAT, H
论文数:
0
引用数:
0
h-index:
0
机构:
Inst of Physical Chemistry, Bonn, West Ger, Inst of Physical Chemistry, Bonn, West Ger
BALTRUSCHAT, H
RACH, E
论文数:
0
引用数:
0
h-index:
0
机构:
Inst of Physical Chemistry, Bonn, West Ger, Inst of Physical Chemistry, Bonn, West Ger
RACH, E
HEITBAUM, J
论文数:
0
引用数:
0
h-index:
0
机构:
Inst of Physical Chemistry, Bonn, West Ger, Inst of Physical Chemistry, Bonn, West Ger
HEITBAUM, J
机构
:
[1]
Inst of Physical Chemistry, Bonn, West Ger, Inst of Physical Chemistry, Bonn, West Ger
来源
:
JOURNAL OF ELECTROANALYTICAL CHEMISTRY
|
1985年
/ 194卷
/ 01期
关键词
:
D O I
:
10.1016/0022-0728(85)87009-1
中图分类号
:
O65 [分析化学];
学科分类号
:
070302 ;
081704 ;
摘要
:
30
引用
收藏
页码:109 / 122
页数:14
相关论文
共 32 条
[31]
SURFACE-ENHANCED RAMAN-SPECTROSCOPY OF ELECTROCHEMICALLY CHARACTERIZED INTERFACES - RELATIONS BETWEEN RAMAN-SCATTERING INTENSITY AND SURFACE COVERAGE FOR SIMPLE ANIONIC ADSORBATES
[J].
WEAVER, MJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, RES LAB, SAN JOSE, CA 95193 USA
IBM CORP, RES LAB, SAN JOSE, CA 95193 USA
WEAVER, MJ
;
HUPP, JT
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, RES LAB, SAN JOSE, CA 95193 USA
IBM CORP, RES LAB, SAN JOSE, CA 95193 USA
HUPP, JT
;
BARZ, F
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, RES LAB, SAN JOSE, CA 95193 USA
IBM CORP, RES LAB, SAN JOSE, CA 95193 USA
BARZ, F
;
GORDON, JG
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, RES LAB, SAN JOSE, CA 95193 USA
IBM CORP, RES LAB, SAN JOSE, CA 95193 USA
GORDON, JG
;
PHILPOTT, MR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, RES LAB, SAN JOSE, CA 95193 USA
IBM CORP, RES LAB, SAN JOSE, CA 95193 USA
PHILPOTT, MR
.
JOURNAL OF ELECTROANALYTICAL CHEMISTRY,
1984,
160
(1-2)
:321
-333
[32]
Woods R., 1976, ELECTROANALYTICAL CH, V9, P1
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共 32 条
[31]
SURFACE-ENHANCED RAMAN-SPECTROSCOPY OF ELECTROCHEMICALLY CHARACTERIZED INTERFACES - RELATIONS BETWEEN RAMAN-SCATTERING INTENSITY AND SURFACE COVERAGE FOR SIMPLE ANIONIC ADSORBATES
[J].
WEAVER, MJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, RES LAB, SAN JOSE, CA 95193 USA
IBM CORP, RES LAB, SAN JOSE, CA 95193 USA
WEAVER, MJ
;
HUPP, JT
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, RES LAB, SAN JOSE, CA 95193 USA
IBM CORP, RES LAB, SAN JOSE, CA 95193 USA
HUPP, JT
;
BARZ, F
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, RES LAB, SAN JOSE, CA 95193 USA
IBM CORP, RES LAB, SAN JOSE, CA 95193 USA
BARZ, F
;
GORDON, JG
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, RES LAB, SAN JOSE, CA 95193 USA
IBM CORP, RES LAB, SAN JOSE, CA 95193 USA
GORDON, JG
;
PHILPOTT, MR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, RES LAB, SAN JOSE, CA 95193 USA
IBM CORP, RES LAB, SAN JOSE, CA 95193 USA
PHILPOTT, MR
.
JOURNAL OF ELECTROANALYTICAL CHEMISTRY,
1984,
160
(1-2)
:321
-333
[32]
Woods R., 1976, ELECTROANALYTICAL CH, V9, P1
←
1
2
3
4
→