PLANAR INGAAS/INP PINFET FABRICATED BY BE ION-IMPLANTATION

被引:12
作者
HATA, S
IKEDA, M
AMANO, T
MOTOSUGI, G
KURUMADA, K
机构
[1] NTT, Atsugi Electrical Communication, Lab, Atsugi, Jpn, NTT, Atsugi Electrical Communication Lab, Atsugi, Jpn
关键词
D O I
10.1049/el:19840644
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
6
引用
收藏
页码:947 / 948
页数:2
相关论文
共 6 条
  • [1] EFFECT OF BAKING TEMPERATURE ON PURITY OF LPE GA0.47IN0.53AS
    AMANO, T
    TAKAHEI, K
    NAGAI, H
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1981, 20 (11) : 2105 - 2109
  • [2] ASAI K, 1980, 12TH P C SOL STAT DE, P235
  • [3] BACKGROUND CARRIER CONCENTRATION AND ELECTRON-MOBILITY IN LPE IN1-XGAXASYP1-Y LAYERS
    GREENE, PD
    WHEELER, SA
    ADAMS, AR
    ELSABBAHY, AN
    AHMAD, CN
    [J]. APPLIED PHYSICS LETTERS, 1979, 35 (01) : 78 - 80
  • [4] INOUE K, 1983, 4TH INT C INT OPT OP, P186
  • [5] KASAHARA K, 1983, 4TH INT C INT OPT OP, P188
  • [6] INTEGRATED IN0.53GA0.47AS P-I-N FET PHOTORECEIVER
    LEHENY, RF
    NAHORY, RE
    POLLACK, MA
    BALLMAN, AA
    BEEBE, ED
    DEWINTER, JC
    MARTIN, RJ
    [J]. ELECTRONICS LETTERS, 1980, 16 (10) : 353 - 355