Measuring the permittivity and permeability of a sample at K-a band using a partially filled waveguide

被引:18
作者
Jarem, JM
Johnson, JB
Albritton, WS
机构
[1] USA,REDSTONE TECH TEST CTR,REDSTONE ARSENAL,AL 35898
[2] AMTEC CORP,HUNTSVILLE,AL 35805
关键词
D O I
10.1109/22.477841
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel method of measuring the relative complex permittivity (epsilon = epsilon' - j epsilon '') and relative complex permeability (mu = mu' j mu '') of material at K-a Band (26.5-40 GHz) using a partially filled waveguide (PFW) (rectangular) and a vector network analyzer (VNA) is presented. The method is based on 1) placing a material sample of length (L) over tilde, width (a) over tilde (waveguide width), and height (d) over tilde less than or equal to (b) over tilde ((b) over tilde is the waveguide height) in a rectangular waveguide, 2) measuring the S-parameters of the sample using the VNA, and 3) inferring the epsilon', epsilon '', mu', and mu '' parameters by comparing the experimental S-parameters with numerically generated S-parameters. The paper presents a method of moments analysis and also a variational formulation of the scattering that occurs from a finite length sample that partially fills a waveguide. Formulas to calculate the complex Poynting power and energy in the waveguide are derived to check the degree to which the numerical solutions obey the conservation of complex power. Numerical methods to extract the material parameters from the S-parameter data are proposed. The experimental PFW S-parameters of a radar absorbing material are measured and its dielectric material parameters are inferred.
引用
收藏
页码:2654 / 2667
页数:14
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