HIGH-DENSITY IMAGE-STORAGE HOLOGRAMS BY A RANDOM PHASE SAMPLING METHOD

被引：20

作者：

TSUNODA, Y ^{[1
]}

TAKEDA, Y ^{[1
]}

机构：

[1] HITACHI LTD,CENT RES LAB,1-280 HIGASHI,KOKUBUNJI,TOKYO,JAPAN

来源：

APPLIED OPTICS | 1974年 / 13卷 / 09期

关键词：

D O I：

10.1364/AO.13.002046

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：2046 / 2051

页数：6

共 11 条

[1]

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[2]

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[3]

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[4]

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[6] RANDOM PHASE DATA MASKS - FABRICATION TOLERANCES AND ADVANTAGES OF 4 PHASE LEVEL MASKS [J].

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FOX, EC ;

FIRESTER, AH .

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[7] RANDOM PHASE SHIFTERS FOR FOURIER TRANSFORMED HOLOGRAMS [J].

TAKEDA, Y ;

MIYAMURA, Y ;

OSHIDA, Y .

APPLIED OPTICS, 1972, 11 (04) :818-&

[8] HOLOGRAM MEMORY WITH HIGH-QUALITY AND HIGH INFORMATION STORAGE DENSITY - HOLOGRAM MEMORY [J].

TAKEDA, Y .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1972, 11 (05) :656-&

[9]

TAKEDA Y, 1971, OYO BUTSURI, V40, P41

[10] HIGH-DENSITY IMAGE-STORAGE HOLOGRAMS BY SAMPLING AND RANDOM PHASE-SHIFTER METHOD [J].

TSUNODA, Y ;

TAKEDA, Y .

JOURNAL OF APPLIED PHYSICS, 1973, 44 (05) :2422-2423

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