EVIDENCE FOR NONUNIFORM FLOW OF CHARGE-CARRIERS THROUGH SEMICONDUCTOR JUNCTIONS

被引：21

作者：

TENNE, R ^{[1
]}

MARCU, V ^{[1
]}

YELLIN, N ^{[1
]}

机构：

[1] SOREQ NUCL RES CTR,DEPT SOLID STATE,IL-70600 YAVNE,ISRAEL

来源：

APPLIED PHYSICS LETTERS | 1984年 / 45卷 / 11期

关键词：

D O I：

10.1063/1.95104

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

15

引用

收藏

页码：1219 / 1221

页数：3

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