SENSITIVITY AND DETECTIVE QUANTUM EFFICIENCY OF ELECTRON-MICROSCOPE PLATES AT HIGH VOLTAGES

被引：5

作者：

AST, DG

机构：

[1] CORNELL UNIV,DEPT MAT SCI & ENGN,ITHACA,NY 14850

[2] CORNELL UNIV,MAT SCI CTR,ITHACA,NY 14850

来源：

关键词：

D O I：

10.1063/1.1663103

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：4638 / 4643

页数：6

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[4]

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[5]

BERRIMAN RW, 1952, SCI IND PHOTO A, V23, P321

[6]

Bethe H. A., 1938, P AM PHILOS SOC, V78, P573

[7]

BIRKHOFF, 1958, HDB PHYSIK, V34, P51

[8]

BLUM J, 1949, CR HEBD ACAD SCI, V228, P918

[9]

BLUM JM, 1951, J PHYS RADIUM, V12, P861

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TRAMMELL, GT .