ATOM PROBE FIELD-ION MICROSCOPY - A TECHNIQUE FOR MICROSTRUCTURAL CHARACTERIZATION OF IRRADIATED MATERIALS ON THE ATOMIC SCALE

被引：32

作者：

MILLER, MK

HETHERINGTON, MG

BURKE, MG

机构：

[1] UNIV OXFORD,DEPT MET & SCI MAT,OXFORD OX1 3PH,ENGLAND

[2] WESTINGHOUSE RES & DEV CTR,PITTSBURGH,PA 15235

来源：

METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE | 1989年 / 20卷 / 12期

关键词：

D O I：

10.1007/BF02670158

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：2651 / 2661

页数：11

共 57 条

[1] RANGE PROFILES OF LOW-ENERGY (100 TO 1500 EV) IMPLANTED HE-3 AND HE-4 ATOMS IN TUNGSTEN .2. ANALYSIS AND DISCUSSION [J].

AMANO, J ;

WAGNER, A ;

SEIDMAN, DN .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 44 (01) :199-222

[2] EXPERIMENTAL-DETERMINATION OF THE PARTICLE REFLECTION COEFFICIENTS OF LOW-ENERGY (100-1500-EV) HE-3 AND HE-4 ATOMS FROM THE (110) PLANE OF TUNGSTEN [J].

AMANO, J ;

SEIDMAN, DN .

JOURNAL OF APPLIED PHYSICS, 1981, 52 (11) :6934-6938

[3] RANGE PROFILES OF LOW-ENERGY (100 TO 1500 EV) IMPLANTED HE-3 AND HE-4 ATOMS IN TUNGSTEN .1. EXPERIMENTAL RESULTS [J].

AMANO, J ;

WAGNER, A ;

SEIDMAN, DN .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 44 (01) :177-198

[4]

AMANO J, 1984, J APPL PHYS, V56, P9834

[5] FIELD-ION MICROSCOPE OBSERVATIONS OF VOIDS IN NEUTRON-IRRADIATED MOLYBDENUM [J].

BRENNER, SS ;

SEIDMAN, DN .

RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1975, 24 (02) :73-78

[6] FIELD-ION MICROSCOPE DETECTION OF ULTRAFINE DEFECTS IN NEUTRON-IRRADIATED FE-0.34 PCT CU ALLOY [J].

BRENNER, SS ;

WAGNER, R ;

SPITZNAGEL, JA .

METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 1978, 9 (12) :1761-1764

[7] SOLUTE CLUSTERING AND PRECIPITATION IN PRESSURE-VESSEL STEELS UNDER LOW FLUENCE IRRADIATION CONDITIONS [J].

BURKE, MG ;

MILLER, MK .

JOURNAL DE PHYSIQUE, 1988, 49 (C-6) :283-288

[8] MICROSTRUCTURAL INVESTIGATION OF IRRADIATED PRESSURE-VESSEL STEEL WELD METAL [J].

BURKE, MG ;

BRENNER, SS .

JOURNAL DE PHYSIQUE, 1986, 47 (C-2) :239-244

[9]

BUSWELL JT, 1988, IN PRESS ASTM STP, V1046

[10] MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE [J].

CEREZO, A ;

GODFREY, TJ ;

GROVENOR, CRM ;

HETHERINGTON, MG ;

HOYLE, RM ;

JAKUBOVICS, JP ;

LIDDLE, JA ;

SMITH, GDW ;

WORRALL, GM .

JOURNAL OF MICROSCOPY-OXFORD, 1989, 154 :215-225

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