STUDY OF THE FIBER MATRIX INTERFACE IN A SIC REINFORCED TITANIUM-ALLOY USING A HIGH-RESOLUTION FIELD-EMISSION AUGER MICROPROBE

被引:8
作者
DUDEK, HJ [1 ]
LARSON, LA [1 ]
BROWNING, R [1 ]
机构
[1] NASA,AMES RES CTR,MOFFETT FIELD,CA 94035
关键词
D O I
10.1002/sia.740060605
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:274 / 278
页数:5
相关论文
共 5 条
[1]  
BROWNING R, 1983, SCANNING ELECTRON MI, V1
[2]  
DUDEK HJ, UNPUB
[3]   REFRACTORY SILICIDES FOR INTEGRATED-CIRCUITS [J].
MURARKA, SP .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (04) :775-792
[4]   SOME PERFORMANCE TESTS OF A MICROAREA AES [J].
TODD, G ;
POPPA, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (02) :672-674
[5]  
WEAST RC, 1982, CRC HDB CHEM PHYSICS