DYNAMIC SCREENING FOR IONIZED IMPURITY SCATTERING IN DEGENERATE SEMICONDUCTORS

被引：11

作者：

CHUNG, WY

FERRY, DK

机构：

来源：

SOLID-STATE ELECTRONICS | 1988年 / 31卷 / 09期

关键词：

D O I：

10.1016/0038-1101(88)90100-1

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1369 / 1374

页数：6

共 15 条

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[9] MONTE-CARLO INVESTIGATION OF THE ELECTRON-HOLE-INTERACTION EFFECTS ON THE ULTRAFAST RELAXATION OF HOT PHOTOEXCITED CARRIERS IN GAAS [J].

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