PERTURBED ANGULAR-DISTRIBUTION STUDIES IN NATURAL, SYNTHETIC CVD AND HPHT DIAMOND

被引：4

作者：

CONNELL, SH ^{[1
]}

SIDERASHADDAD, E ^{[1
]}

BHARUTHRAM, K ^{[1
]}

SMALLMAN, CG ^{[1
]}

SELLSCHOP, JPF ^{[1
]}

BOSSENGER, MG ^{[1
]}

机构：

[1] UNIV DURBAN WESTVILLE,DEPT PHYS,DURBAN 4000,SOUTH AFRICA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1994年 / 85卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(94)95873-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The time differential perturbed angular distribution (TDPAD) technique as applied to semi-conductors and insulators has a unique place among the other analytical methods involving ion beams. It provides an opportunity to study molecular complex-like systems involving the radioactive probe, and also in-situ hot atom chemistry. Both of these aspects are important in understanding dopant-impurity dynamics, particularly in the context of ion-implantation. The very recent advances in the synthetic growth and the defect engineering of diamond have ensured it will be no exception. F-19 TDPAD data for various natural and synthetic diamonds, as well as for some polymer systems, is reviewed in this context, and confirm that F-19 TDPAD could become an extremely sensitive probe of the important but elusive impurity, hydrogen.

引用

页码：508 / 515

页数：8

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