共 17 条
[1]
Burghartz J. N., 1989, International Electron Devices Meeting 1989. Technical Digest (Cat. No.89CH2637-7), P229, DOI 10.1109/IEDM.1989.74267
[2]
Comfort J. H., 1990, International Electron Devices Meeting 1990. Technical Digest (Cat. No.90CH2865-4), P21, DOI 10.1109/IEDM.1990.237235
[3]
Crabbe E. F., 1993, International Electron Devices Meeting 1993. Technical Digest (Cat. No.93CH3361-3), P83, DOI 10.1109/IEDM.1993.347393
[4]
Gomi T., 1988, International Electron Devices Meeting. Technical Digest (IEEE Cat. No.88CH2528-8), P744, DOI 10.1109/IEDM.1988.32919
[5]
IINUMA T, 1992, SEP P BCTM, P92
[6]
ITOH N, 1992, PROCEEDINGS OF THE 1992 BIPOLAR / BICMOS CIRCUITS AND TECHNOLOGY MEETING, P104, DOI 10.1109/BIPOL.1992.274073
[7]
Kikuchi K., 1986, International Electron Devices Meeting 1986. Technical Digest (Cat. No.86CH2381-2), P420
[8]
Meister T. F., 1992, International Electron Devices Meeting 1992. Technical Digest (Cat. No.92CH3211-0), P401, DOI 10.1109/IEDM.1992.307387
[9]
Morimoto T., 1991, International Electron Devices Meeting 1991. Technical Digest (Cat. No.91CH3075-9), P653, DOI 10.1109/IEDM.1991.235387