SUB-20 PS HIGH-SPEED ECL BIPOLAR-TRANSISTOR WITH LOW PARASITIC ARCHITECTURE

被引:3
作者
IINUMA, T
ITOH, N
NAKAJIMA, H
INOU, K
MATSUDA, S
YOSHINO, C
TSUBOI, Y
KATSUMATA, Y
IWAI, H
机构
[1] ULSI Laboratories, Research and Development Center, Toshiba Corporation 1, Komukai-Toshiba-cho, Saiwai-ku, Kawasaki
关键词
D O I
10.1109/16.368035
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Reducing parasitic capacitance and resistance is an effective means of both improving ECL gate delay and increasing f(T) values, In this paper, we demonstrate a device with sub-20 ps t(pd) values even at f(T) = 23 GHz, a performance which has been achieved by implementing a number of techniques, These include 1) low-stress deep- and shallow-trench isolation to reduce C-CB, 2) a low-concentration collector design to reduce C-CB; 3) NiSi-salicided base and emitter electrodes to reduce R(B), and 4) a shallow base formed by double diffusion technology for relatively high f(T) with a low-concentration collector design, The low-concentration collector design gives the device a high breakdown voltage of 6.2 V.
引用
收藏
页码:399 / 405
页数:7
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