ELECTRON-DIFFRACTION AND ELECTRON-MICROSCOPY METHODS FOR STUDY OF ORDERING IN CRYSTALS

被引：1

作者：

COWLEY, JM ^{[1
]}

机构：

[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1975年 / 8卷 / APR1期

关键词：

D O I：

10.1107/S0021889875010175

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：204 / 204

页数：1

共 12 条

[1]

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SPARGO, AEC .

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[3]

COWLEY, IN PRESS

[4] HIGH-RESOLUTION DARK-FIELD ELECTRON-MICROSCOPY .2. SHORT-RANGE ORDER IN CRYSTALS [J].

COWLEY, JM .

ACTA CRYSTALLOGRAPHICA SECTION A, 1973, A 29 (SEP1) :537-&

[5] HIGH-RESOLUTION DARK-FIELD ELECTRON-MICROSCOPY .1. USEFUL APPROXIMATIONS [J].

COWLEY, JM .

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1973, A 29 (SEP1) :529-536

[6]

FISHER PMJ, 1965, P INT C ELECTRON DIF

[7]

IIJIMA, IN PRESS

[8] HIGH-RESOLUTION ELECTRON MICROSCOPY OF CRYSTAL LATTICE OF TITANIUM-NIOBIUM OXIDE [J].

IIJIMA, S .

JOURNAL OF APPLIED PHYSICS, 1971, 42 (13) :5891-+

[9] DIRECT OBSERVATION OF POINT-DEFECTS IN NB12O29 BY HIGH-RESOLUTION ELECTRON-MICROSCOPY [J].

IIJIMA, S ;

KIMURA, S ;

GOTO, M .

ACTA CRYSTALLOGRAPHICA SECTION A, 1973, A 29 (NOV1) :632-636

[10]

IIJIMA S, 1974, ACTA CRYSTALLOGR A, VA 30, P22, DOI 10.1107/S0567739474000039

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