BACKSCATTER KIKUCHI DIFFRACTION IN THE SEM FOR IDENTIFICATION OF CRYSTALLOGRAPHIC POINT GROUPS

被引:55
作者
BABAKISHI, KZ [1 ]
DINGLEY, DJ [1 ]
机构
[1] UNIV BRISTOL,HH WILLS PHYS LAB,BRISTOL BS8 1TL,AVON,ENGLAND
关键词
D O I
10.1002/sca.4950110605
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:305 / 312
页数:8
相关论文
共 5 条
[1]   APPLICATION OF BACKSCATTER KIKUCHI DIFFRACTION IN THE SCANNING ELECTRON-MICROSCOPE TO THE STUDY OF NIS2 [J].
BABAKISHI, KZ ;
DINGLEY, DJ .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1989, 22 :189-200
[2]   A SCANNING ELECTRON-MICROSCOPE STAGE FOR CRYSTAL ORIENTATION AND STRUCTURE DETERMINATION [J].
BENNETT, BW ;
PICKERING, HW .
SCRIPTA METALLURGICA, 1984, 18 (07) :743-748
[3]  
DINGLEY DJ, 1986, SCANNING ELECTRON MI, V2, P383
[4]   ON THE BREAKDOWN OF FRIEDEL LAW IN ELECTRON BACKSCATTERING CHANNELING PATTERNS [J].
MARTHINSEN, K ;
HOIER, R .
ACTA CRYSTALLOGRAPHICA SECTION A, 1988, 44 :700-707
[5]  
MARTHINSEN K, ACTA CRYSTALLOGR A, V44, P693