APPLICATION OF BACKSCATTER KIKUCHI DIFFRACTION IN THE SCANNING ELECTRON-MICROSCOPE TO THE STUDY OF NIS2

[1] BABAKISHI K, 1986, 11TH P INT C EL MICR, P741

[2] BABAKISHI KZ, 1987, MICROANALYSIS HIGH S

[3] BABAKISHI KZ, 1987, I PHYS C SER, V90, P135

[4] Cullity B.D, 1959, XRAY DIFFRACTION, Vsecond

[5] DINGLEY DJ, 1981, I PHYS C SERIES, V61, P541

[6] DINGLEY DJ, 1986, 11 P INT C EL MICR K, P753

[7] DINGLEY DJ, 1986, SCANNING ELECTRON MI, V2, P383

[8] Faktor M.M., 1974, GROWTH CRYSTALS VAPO

[9] Rao C. N. R., 1976, PROGR SOLID STATE CH, V10, P207, DOI DOI 10.1016/0079-6786(76)90009-1

[10] X-ray diffraction measurements on metallic and semiconducting hexagonal NiS [J]. PHYSICAL REVIEW B-SOLID STATE, 1970, 2 (08): : 2859 - 2863

[1] BABAKISHI K, 1986, 11TH P INT C EL MICR, P741

[2] BABAKISHI KZ, 1987, MICROANALYSIS HIGH S

[3] BABAKISHI KZ, 1987, I PHYS C SER, V90, P135

[4] Cullity B.D, 1959, XRAY DIFFRACTION, Vsecond

[5] DINGLEY DJ, 1981, I PHYS C SERIES, V61, P541

[6] DINGLEY DJ, 1986, 11 P INT C EL MICR K, P753

[7] DINGLEY DJ, 1986, SCANNING ELECTRON MI, V2, P383

[8] Faktor M.M., 1974, GROWTH CRYSTALS VAPO

[9] Rao C. N. R., 1976, PROGR SOLID STATE CH, V10, P207, DOI DOI 10.1016/0079-6786(76)90009-1

[10] X-ray diffraction measurements on metallic and semiconducting hexagonal NiS [J]. PHYSICAL REVIEW B-SOLID STATE, 1970, 2 (08): : 2859 - 2863