SEPARATE DETERMINATION OF CONCENTRATION PROFILES FOR ATOMS WITH DIFFERENT MASSES BY SIMULTANEOUS MEASUREMENT OF SCATTERED PROJECTILE AND RECOIL ENERGIES

被引：25

作者：

KLEIN, SS

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1986年 / 15卷 / 1-6期

关键词：

D O I：

10.1016/0168-583X(86)90344-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：464 / 468

页数：5

共 8 条

[1] NONDESTRUCTIVE ANALYSIS FOR TRACE AMOUNTS OF HYDROGEN [J].

COHEN, BL ;

DEGNAN, JH ;

FINK, CL .

JOURNAL OF APPLIED PHYSICS, 1972, 43 (01) :19-&

[2] TIME-OF-FLIGHT SYSTEM FOR PROFILING RECOILED LIGHT-ELEMENTS [J].

GROLEAU, R ;

GUJRATHI, SC ;

MARTIN, JP .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3) :11-15

[3] USE OF LI-6 AND CL-35 ION-BEAMS IN SURFACE ANALYSIS [J].

LECUYER, J ;

BRASSARD, C ;

CARDINAL, C ;

TERREAULT, B .

NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3) :271-277

[4] QUANTITATIVE-ANALYSIS OF LIGHT-ELEMENTS IN A HEAVY MATERIAL BY HIGH-ENERGY ION RECOIL (HEIR) SPECTROMETRY [J].

MOREAU, C ;

KNYSTAUTAS, EJ ;

TIMSIT, RS ;

GROLEAU, R .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3) :111-115

[5] ELASTIC RECOIL DETECTION ANALYSIS OF LIGHT PARTICLES (H-1-O-16) USING 30 MEV SULFUR IONS [J].

NOLSCHER, C ;

BRENNER, K ;

KNAUF, R ;

SCHMIDT, W .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3) :116-119

[6]

Northcliffe L. S., 1970, NUCL DATA A, V7, P233

[7]

THOMAS JP, 1983, NUCL INSTRUM METHODS, V218, P125, DOI 10.1016/0167-5087(83)90967-5

[8] APPLICATION OF HIGH-RESOLUTION RUTHERFORD BACKSCATTERING TECHNIQUES TO NEAR-SURFACE ANALYSIS [J].

WILLIAMS, JS .

NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3) :207-217

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