INFLUENCE OF SCREENING EFFECTS ON AUGER RECOMBINATION IN SEMICONDUCTORS

被引：37

作者：

HAUG, A ^{[1
]}

EKARDT, W ^{[1
]}

机构：

[1] TECH UNIV BERLIN,INST THEORET PHYS 2,STR 17 JUNI 135,D-1000 BERLIN,FED REP GER

来源：

SOLID STATE COMMUNICATIONS | 1975年 / 17卷 / 03期

关键词：

D O I：

10.1016/0038-1098(75)90290-2

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：267 / 268

页数：2

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[9] SPECTRUM AND DECAY OF RECOMBINATION RADIATION FROM STRONGLY EXCITED SILICON [J].

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[10]

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