ITERATIVE EXHAUSTIVE PATTERN GENERATION FOR LOGIC TESTING

被引：33

作者：

TANG, DT ^{[1
]}

CHEN, CL ^{[1
]}

机构：

[1] IBM CORP,DIV RES,DEPT COMP SCI,VLSI PROJECTS,YORKTOWN HTS,NY 10598

来源：

关键词：

D O I：

10.1147/rd.282.0212

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：212 / 219

页数：8

共 11 条

[1]

AGARWAL VK, 1981, IEEE T COMPUT, V30, P855, DOI 10.1109/TC.1981.1675716

[2]

BARZILAI DZ, 1983, IEEE T COMPUTERS, V32, P190

[3]

BARZILAI Z, 1981, DIGEST PAPERS, P102

[4]

Berge C., 1973, GRAPHS HYPERGRAPHS, V7

[5]

CHANDRA AK, 1981, RC8936 IBM TJ WATS R

[6]

McCluskey E. J., 1982, Digest of Papers 1982 International Test Conference, P183

[7]

MCCLUSKEY EJ, 1981, IEEE T COMPUT, V30, P866, DOI 10.1109/TC.1981.1675717

[8] LSI LOGIC TESTING - AN OVERVIEW [J].

MUEHLDORF, EI ;

SAVKAR, AD .

[9]

TANG D, 1983, 13TH P FAULT TOL COM, P222

[10]

TANG DT, 1983, IEEE T COMPUT, V32, P1145, DOI 10.1109/TC.1983.1676175