LSI LOGIC TESTING - AN OVERVIEW

被引：29

作者：

MUEHLDORF, EI ^{[1
]}

SAVKAR, AD ^{[1
]}

机构：

[1] IBM CORP, DIV GEN TECHNOL, Essex Jct, VT 05452 USA

来源：

IEEE TRANSACTIONS ON COMPUTERS | 1981年 / 30卷 / 01期

关键词：

D O I：

10.1109/TC.1981.6312152

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：1 / 17

页数：17

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